An advanced electric probing system: Measuring DNA derivatives

Journal of Chemical Physics

Volumn 118, Issue 17, 2003, Pages 8016-8022

  Shimotani, Kei ^a   Shigematsu, Taishi ^a   Manabe, Chikara ^a   Watanabe, Hiroyuki ^a   Shimizu, Masaaki ^a  

^a FUJI XEROX CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIOELECTRIC PHENOMENA; CARBON NANOTUBES; CROSSLINKING; CURRENT VOLTAGE CHARACTERISTICS; DERIVATIVES; DOPING (ADDITIVES); ELECTRIC VARIABLES MEASUREMENT; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; TRANSPORT PROPERTIES;

DNA DERIVATIVES; ELECTRIC ISOLATION; ELECTRIC PROBING SYSTEM; ELECTRIC TRANSPORT MECHANISMS;

DNA;

EID: 0037500341     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1563612     Document Type: Article

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