Electrical and structural characteristics of PbTiO3 thin films with ultra-thin Al2O3 buffer layers

Materials Chemistry and Physics

Volumn 78, Issue 2, 2003, Pages 412-415

  Sun, C L ^a   Chen, S Y ^a   Yang, M Y ^a   Chin, Albert ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Capacitance voltage; Dielectric constant; PbTiO3; Thin films

Indexed keywords

ALUMINA; CAPACITANCE; CURRENT DENSITY; ELECTRIC POTENTIAL; HYSTERESIS; LEAD COMPOUNDS; PERMITTIVITY; POLYCRYSTALLINE MATERIALS;

CHEMICAL SOLUTION DEPOSITION;

THIN FILMS;

EID: 0037449973     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(02)00199-2     Document Type: Article

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