Growth and polarization features of highly (100) oriented Pb(Zr0.53Ti0.47)O3 films on Si with ultrathin SiO2 buffer layer

Applied Physics Letters

Volumn 73, Issue 19, 1998, Pages 2781-2783

  Lin, Y ^a,b   Zhao, B R ^a   Peng, H B ^a   Xu, B ^a   Chen, H ^a   Wu, F ^a   Tao, H J ^a   Zhao, Z X ^a   Chen, J S ^b  

^a INSTITUTE OF PHYSICS   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000568319     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122589     Document Type: Article

References (10)

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