X-ray microbeam measurement of local texture and strain in metals

Materials Research Society Symposium - Proceedings

Volumn 563, Issue , 1999, Pages 169-174

  Chung, Jin Seok ^a   Tamura, N ^a   Ice, G E ^a   Larson, B C ^a   Budai, J D ^a   Lowe, Walter ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b HOWARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; METALLOGRAPHIC MICROSTRUCTURE; STRAIN MEASUREMENT; X RAY ANALYSIS;

X-RAY MICROBEAM ANALYSIS;

ELECTRIC CONTACTS;

EID: 0033284076     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-563-169     Document Type: Article

References (11)

1. D. J. Dingley and V. Randle, J. Mater. Sci. 27, p. 4545 (1992).
2. Jin-Seok Chung and Gene E. Ice, Mat. Res. Soc. Symp. proc., Vol. 524 (1998).
3. Jin-Seok Chung and Gene E. Ice, submitted to J. Appl. Phys., 1999.
4. W. R. Busing and H. A. Levy, Acta Cryst. 22, p. 457 (1967).
5. I. C. Noyan, J. B. Cohen, Residual Stress, Springer-Verlag, New York, N Y, 1987, p.20.
6. Gene Ice, Bernie Riemer, and Ali Khounsary, SPIE proc., Vol. 2856, p. 226 (1996).
7. N. Tamura, J.-S. Chung, G. E. Ice, B. C. Larson, J. D. Budai, J. Z. Tischler, M. Yoon, E. L. Williams, W. P. Lowe, Mat. Res. Soc. Symp. proc., Vol. 563 (1999).
8. J. M. Blocher, Jr., J. Vac. Sci. Technol. 11, p. 680 (1974).
9. R. Hergt and H. Pfeiffer, Phys. Stat. Sol. (a) 92, p. K89 (1985).
10. J. A. Thornton, Ann. Rev. Mater. Sci. 7, p. 239 (1977).
11. P.C. Wang, G.S. Cargill III, I.C. Noyan, and C.-K. Hu, Appl. Physics Lett. 72, pp. 1296-1299 (1998).