Generation and absorption of characteristic X-rays under dynamical electron diffraction conditions

Micron

Volumn 28, Issue 2, 1997, Pages 125-137

  Rossouw, C J ^a   Forwood, C T ^a   Gibson, M A ^a   Miller, P R ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030849765     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(96)00050-9     Document Type: Article

References (33)

1. Allen, L. J. and Josefsson, T. W., 1995. Inelastic scattering of fast electrons by crystals. Phys. Rev. B, 52, 3184-3198.
2. Allen, L. J. and Rossouw, C. J., 1989. Effects of thermal scattering and surface tilt on diffraction and channeling of fast electrons in CdTe. Phys. Rev. B, 39, 8313-8321.
3. Allen, L. J. and Rossouw, C. J., 1993. Delocalization in electron impact ionization in a crystalline environment. Phys. Rev. B, 47, 2446-2452.
4. Bird, D. M. and King, Q. A., 1990. Absorptive form factors for high energy electron diffraction. Acta Cryst., A46, 202-208.
5. Cherns, D., Howie, A. and Jacobs, M. H., 1973. Characteristic X-ray production in thin crystals. Z. Naturforsch., 28a, 565-571.
6. Doyle, P. A. and Turner, P. S., 1968. Relativistic Hartree-Fock X-ray and electron scattering factors. Acta Cryst., A24, 390-397.
7. Duncumb, P., 1962. Enhanced X-ray emission from extinction contours in a single crystal gold film. Phil. Mag., 7, 2101-2105.
8. Goldstein, J. I., Costley, J. L., Lorimer, G. W., and Reed, S. J.B., 1977. Quantitative X-ray analysis in the electron microscope. In Scanning Electron Microscopy, ed. Johari. IITR, Chicago, pp. 315-324..
9. Heinrich, K. F. J., 1986. Mass absorption coefficients for electron probe microanalysis. 11th International Congress on X-ray Optics and Microanalysis, eds J. D. Brown and R. H. Packwood. London, Ontario, pp. 67-72..
10. Hirsch, P. B., Howie, A. and Whelan, M. J., 1962. On the production of X-rays in thin metal foils. Phil. Mag., 7, 2095-2100.
11. Horita, Z., Sano, T. and Nemoto, M., 1991. A new form of the extrapolation method for absorption correction in quantitative X-ray microanalysis with the analytical electron microscope. Ultramicroscopy, 35, 27-36.
12. Josefsson, T. W., Allen, L. J., Miller, P. R. and Rossouw, C. J., 1994. K-shell ionization under zone axis electron diffraction conditions. Phys. Rev. B, 50, 6673-6684.
13. Kainuma, Y., 1955. The theory of Kikuchi patterns. Acta Cryst., 8, 247-257.
14. Lynch, D. F. and Rossouw, C. J., 1987. Non-zeroth-order Laue Zone Effects and ALCHEMI. Ultramicroscopy, 21, 69-76.
15. Maslen, V. W. and Rossouw, C. J., 1983. The inelastic scattering matrix element and its application to electron energy loss spectroscopy. Phil. Mag. A, 47, 119-130.
16. Maslen, V. W. and Rossouw, C. J., 1984. Implications of (e,2e) scattering for inelastic electron diffraction in crystals. I. Theoretical. Phil. Mag. A. 49, 735-742.
17. Nuchter, W. and Siegle, W., 1995. Electron channelling: a method in real-space crystallography and a comparison with the atomic location by channelling enhanced microanalysis. Phil. Mag. A. 71, 165-186.
18. Pennycook, S. J., 1988. Delocalization corrections for electron channelling analysis. Ultramicroscopy, 26, 239-248.
19. Radi, G., 1970. Complex lattice potentials in electron diffraction calculated for a number of crystals. Acta Cryst., A26, 41-56.
20. Rez, P., 1976. The theory of inelastic scattering in the electron microscopy of crystals. D.Phil. thesis, Department of Materials. University of Oxford..
21. Rossouw, C. J., 1995. Incoherent contrast under dynamical diffraction conditions. Ultramicroscopy, 58, 211-222.
22. Rossouw, C. J., Gibson, M. A. and Forwood, C. T., 1996c. CBED ZOLZ and HOLZ analysis of order in TiAl alloys. Phil. Mag. A, 73, 187-201.
23. Rossouw, C. J., Forwood, C. T., Gibson, M. A. and Miller, P. R., 1996a. Statistical ALCHEMI: General formulation and method with application to TiAl ternary alloys. Phil. Mag. A, 74, 57-76.
24. Rossouw, C. J., Forwood, C. T., Gibson, M. A. and Miller, P. R., 1996b. Zone axis CBED and ALCHEMI analysis of TiAl alloys with ternary additions. Phil. Mag. A, 76, 77-102.
25. Rossouw, C. J., Gibson, M. A., and Forwood, C. T., 1997. Dynamical electron diffraction analysis of lattice parameters, Debye-Waller factors and order in Ti-Al and Ti-Ga alloys. Ultramicroscopy (in press).
26. Rossouw, C. J., Miller, P. R., Josefsson, T. W. and Allen, L. J., 1994. Zone axis backscattered electron contrast for fast electrons. Phil. Mag. A, 70, 985-998.
27. Rossouw, C. J. and Maslen, V. W., 1984. Implications of (e,2e) scattering for inelastic electron diffraction in crystals. II. Application of the theory. Phil. Mag. A, 49, 743-758.
28. Rossouw, C. J. and Whelan, M. J., 1981. Diffraction contrast retained by plasmon and K-loss electrons. Ultramicroscopy, 6, 53-66.
29. Shirai, Y. and Yamaguchi, M., 1992. Studies of vacancies and dislocations in TiAl by positron annihilation. Mater. Sci. Eng., A152, 173-181.
30. Whelan, M. J., 1965. Inelastic scattering of fast electrons by crystals I. Interband excitations. J. Applied Physics, 36, 2099-2103.
31. Whelan, M. J., 1965. Inelastic scattering of fast electrons by crystals. II. Phonon scattering. J. Applied Physics, 36, 2103-2110.
32. Yoshioka, H., 1957. Effect of inelastic waves on electron diffraction. J. Phys. Soc. Japan, 12, 618-628.
33. Young, A. P. and Rez, P., 1975. Resonance errors and partial coherence in the inelastic scattering of fast electrons by crystal excitations. J. Phys. C, 8, L1-L7.