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Volumn 66, Issue 1-4, 2003, Pages 373-378
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Effect of nitrogen doping on the minority carrier lifetime in Czochralski silicon
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Author keywords
Lifetime; Nitrogen; Passivation; Silicon
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Indexed keywords
ANNEALING;
CHARGE CARRIERS;
PASSIVATION;
PRECIPITATION (CHEMICAL);
SEMICONDUCTOR DOPING;
SILICON WAFERS;
PHOTOCONDUCTIVE DECAY (PCD);
CRYSTAL GROWTH FROM MELT;
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EID: 0037395265
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-9317(02)00949-8 Document Type: Conference Paper |
Times cited : (11)
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References (16)
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