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Volumn 66, Issue 1-4, 2003, Pages 373-378

Effect of nitrogen doping on the minority carrier lifetime in Czochralski silicon

Author keywords

Lifetime; Nitrogen; Passivation; Silicon

Indexed keywords

ANNEALING; CHARGE CARRIERS; PASSIVATION; PRECIPITATION (CHEMICAL); SEMICONDUCTOR DOPING; SILICON WAFERS;

EID: 0037395265     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(02)00949-8     Document Type: Conference Paper
Times cited : (11)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.