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Volumn 273-274, Issue , 1999, Pages 308-311

Oxygen precipitation in nitrogen-doped Czochralski silicon

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH FROM MELT; NITROGEN; PRECIPITATION (CHEMICAL); SEMICONDUCTOR DOPING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033345573     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00453-6     Document Type: Article
Times cited : (46)

References (14)
  • 3
    • 3342989192 scopus 로고
    • H.R. Huff, R.J. Kriegler, Y. Takeishi, (Eds.), ECS
    • K. Sumino, in: H.R. Huff, R.J. Kriegler, Y. Takeishi, (Eds.), Semiconductor Silicon, ECS, 1981, p. 208.
    • (1981) Semiconductor Silicon , pp. 208
    • Sumino, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.