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Volumn 68, Issue 4, 1996, Pages 487-489
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Effect of nitrogen-oxygen complex on electrical properties of Czochralski silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000358670
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.116422 Document Type: Article |
Times cited : (79)
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References (12)
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