Electron energy loss studies of dislocations in GaN thin films

Journal of Applied Physics

Volumn 93, Issue 5, 2003, Pages 2728-2735

  Bangert, U ^a   Gutierrez Sosa A ^a   Harvey, A J ^a   Fall, C J ^b   Jones, R ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF EXETER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRON ENERGY LOSS SPECTROSCOPY; EPITAXIAL GROWTH; GALLIUM NITRIDE; SCANNING ELECTRON MICROSCOPY;

CORE EXCITATION LOSSES;

THIN FILMS;

EID: 0037351657     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1542690     Document Type: Article

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