Probing the local dielectric/optical properties of group III-nitrides by spatially resolved EELS on the nanometer scale

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 59, Issue 1-3, 1999, Pages 155-158

  Brockt, G ^a   Lakner, H ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (SPECIFIC GRAVITY); DIELECTRIC PROPERTIES; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONIC STRUCTURE; ELLIPSOMETRY; ENERGY GAP; MATHEMATICAL TRANSFORMATIONS; OPTICAL PROPERTIES; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS;

ALUMINUM NITRIDE; GALLIUM NITRIDE; INDIUM NITRIDE; KRAMERS-KRONIG TRANSFORMATION; NANOMETER SCALE; PLASMON EXCITATIONS; PLASMON TRANSITION; SPATIAL RESOLUTION; SUBNANOMETER ELECTRON PROBES;

HETEROJUNCTIONS;

EID: 0033528903     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(98)00385-7     Document Type: Article

References (8)

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