메뉴 건너뛰기




Volumn 6, Issue 3, 2003, Pages

Electrical characterization of impurity-free disordered p-type GaAs

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHARACTERIZATION; DEEP LEVEL TRANSIENT SPECTROSCOPY; OPTOELECTRONIC DEVICES; SEGREGATION (METALLOGRAPHY); VOLTAGE MEASUREMENT;

EID: 0037342126     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1543335     Document Type: Article
Times cited : (5)

References (32)
  • 6
    • 0035439930 scopus 로고    scopus 로고
    • P. N. K. Deenapanray, H. H. Tan, M. I. Cohen, K. Gaff, M. Petravic, and C. Jagadish, J. Electrochem. Soc., 147, 1950 (2000); P. N. K. Deenapanray and C. Jagadish, J. Vac. Sci. Technol. B. 19, 1962 (2001).
    • (2001) J. Vac. Sci. Technol. B. , vol.19 , pp. 1962
    • Deenapanray, P.N.K.1    Jagadish, C.2
  • 20
    • 0031248709 scopus 로고    scopus 로고
    • and references therein
    • R. M. Cohen, Mater. Sci. Eng., R., 20, 167 (1997), and references therein.
    • (1997) Mater. Sci. Eng., R. , vol.20 , pp. 167
    • Cohen, R.M.1
  • 30
    • 0012447503 scopus 로고    scopus 로고
    • P. N. K. Deenapanray, H. H. Tan, C. Jagadish, and F. D. Auret, Appl. Phys. Lett., 77, 696 (2000); J. Appl. Phys., 88, 5255 (2000).
    • (2000) J. Appl. Phys. , vol.88 , pp. 5255


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.