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Electrochemical and Solid-State Letters

Volumn 4, Issue 2, 2001, Pages

Effect of stress on impurity-free quantum well intermixing

(2) Deenapanray, Prakash N K a Jagadish, C a

a AUSTRALIAN NATIONAL UNIVERSITY (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELLIPSOMETRY; EPITAXIAL GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HETEROJUNCTIONS; IMPURITIES; PHOTOLUMINESCENCE; RAPID THERMAL ANNEALING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON COMPOUNDS;

BLUE SHIFT; CAPPING LAYER; IMPURITY-FREE VACANCY INTERDIFFUSION; INTERDIFFUSION; INTERMIXING; SPECTROSCOPIC ELLIPSOMETRY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0035262735 PISSN: 10990062 EISSN: None Source Type: Journal
DOI: 10.1149/1.1339242 Document Type: Article

Times cited : (25)

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