Low-temperature current-voltage characteristics of MIS Cu/n-GaAs and inhomogeneous Cu/n-GaAs Schottky diodes

Physica B: Condensed Matter

Volumn 325, Issue , 2003, Pages 138-148

  Biber, M ^a  

^a ATATÜRK UNIVERSITY   (Turkey)

Author keywords

Barrier height inhomogeneity; Metal semiconductor contacts; MIS structure

Indexed keywords

COPPER; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONTACTS; INTERFACES (MATERIALS); SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR METAL BOUNDARIES;

INTERFACIAL LAYERS;

SCHOTTKY BARRIER DIODES;

EID: 0037213847     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(02)01515-6     Document Type: Article

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