Dynamics of the tip-sample interaction in near-field scanning optical microscopy and the implications for shear force as an accurate distance measure

Applied Physics Letters

Volumn 81, Issue 21, 2002, Pages 4055-4057

  Jahncke, C L ^a   Huerth, S H ^b   Clark III, Beverly ^b   Hallen, H D ^b  

^a ST LAWRENCE UNIVERSITY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DAMPING; FRICTION; NONLINEAR SYSTEMS; OSCILLATIONS; SURFACE PROPERTIES;

SHEAR FORCE;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 0037132270     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1520711     Document Type: Article

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