Study of shear force as a distance regulation mechanism for scanning near-field optical microscopy

Journal of Applied Physics

Volumn 79, Issue 3, 1996, Pages 1219-1223

  Durkan, C ^a   Shvets, I V ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000434544     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361014     Document Type: Article

References (9)

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5. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. 61, 4723 (1987).
6. E. Betzig, A. Harootunian, A. Lewis, and M. Isaacson, Appl. Opt. 25, 1890 (1986).
7. I. V. Shvets and S. Madsen, Irish Patent No. S63296, 1995.
8. For instance, Sutter puller, model P-87.
9. Agar Scientific transmission electron microscopy test sample no. S-107.