Optical investigation of micrometer and nanometer-size individual GaN pillars fabricated by reactive ion etching

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 6520-6523

  Demangeot, F ^a   Gleize, J ^a   Frandon, J ^a   Renucci, M A ^a   Kuball, M ^b   Peyrade, D ^c   Manin Ferlazzo, L ^c   Chen, Y ^c   Grandjean, N ^d  

^a CNRS   (France)

^b UNIVERSITY OF BRISTOL   (United Kingdom)

^c UNIV PARIS SUD   (France)

^d CRHEA CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONSISTENT VARIATION; GAN QUANTUM DOTS; MICRO-RAMAN; MICROPHOTOLUMINESCENCE; NANO STRUCTURATION; NANOMETER SIZE; OPTICAL INVESTIGATION; OPTICAL MEASUREMENT; PL MAPPING; SINGLE QUANTUM; SPECTROSCOPIC STUDIES;

FABRICATION; OPTICAL DATA PROCESSING; REACTIVE ION ETCHING; SPECTROSCOPIC ANALYSIS;

GALLIUM NITRIDE;

EID: 0037094861     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1468908     Document Type: Article

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