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Volumn 81, Issue 20, 2002, Pages 3849-3851

Fabrication of submicron-scale SrTiO3-δ devices by an atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FIELD EFFECT TRANSISTORS; SEMICONDUCTOR DEVICE MANUFACTURE; STRONTIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EID: 0037065056     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1521583     Document Type: Article
Times cited : (75)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.