Estimation of trap levels in SrTiO3 epitaxial films from measurement of (LaSr)MnO3/SrTiO3/(LaSr)TiO3 p-i-n diode characteristics

Journal of Applied Physics

Volumn 90, Issue 1, 2001, Pages 187-191

  Sugiura, Masanori ^a   Uragou, Kazuyuki ^a   Tachiki, Minoru ^a   Kobayashi, Takeshi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035395417     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1334638     Document Type: Article

References (12)

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