Absolute calibration of a multilayer-based XUV diagnostic

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 492, Issue 1-2, 2002, Pages 305-316

  Stuik, Remko ^a   Scholze, Frank ^b   Tümmler, Johannes ^b   Bijkerk, Fred ^a  

^a FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Absolute calibration; XUV source characterization; XUV source diagnostics

Indexed keywords

BANDWIDTH; CALIBRATION; LASER PRODUCED PLASMAS; LIGHT SOURCES; SPECTRUM ANALYSIS; STORAGE RINGS; ULTRAVIOLET RADIATION;

OPTICAL ELEMENTS;

DIAGNOSTIC RADIOGRAPHY;

EID: 0037063849     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)01350-5     Document Type: Article

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