Focusing crystal von Hamos spectrometer for X-ray spectroscopy and X-ray fluorescence applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4144, Issue 1, 2000, Pages 148-154

  Shevelko, Alexander P ^a   Antonov, Alexander A ^a   Grigorieva, Inna G ^a   Kasyanov, Yury S ^a   Knight, Larry V ^b   Reyes Mena, A ^c   Turner, Clark ^c   Wang, Quan ^b   Yakushev, Oleg F ^a  

^a LEBEDEV PHYSICAL INSTITUTE   (Russian Federation)

^b Brigham Young University   (United States)

^c MOXTEK INC   (United States)

Author keywords

bent crystals; X ray fluorescence; X ray spectroscopy

Indexed keywords

FLUORESCENCE; FOCUSING; GRAPHITE; MICA; REFLECTION; SPECTROMETERS;

BENT CRYSTALS; VAN HAMOS SPECTROMETERS; X-RAY FLUORESCENCE;

X RAY SPECTROSCOPY;

EID: 0034508277     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.405901     Document Type: Article

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