Scanning nanoscale multiprobes for conductivity measurements

Review of Scientific Instruments

Volumn 71, Issue 7, 2000, Pages 2781-2783

  Boggild P ^a   Hansen, T M ^a   Kuhn, O ^a   Grey, F ^a   Junno, T ^b   Montelius, L ^b  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041681696     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150692     Document Type: Article

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