In situ TEM observation of dislocation motion in thermally strained Al nanowires

Acta Materialia

Volumn 50, Issue 20, 2002, Pages 5033-5047

  Inkson, Beverley J ^a   Dehm, G ^b   Wagner, T ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Al Al2O3; Dislocation; Interface; Thermal stress; Thin films

Indexed keywords

ALUMINA; EPITAXIAL GROWTH; NANOSTRUCTURED MATERIALS; THERMAL EXPANSION; THERMAL STRESS; TRANSMISSION ELECTRON MICROSCOPY;

NANOWIRES;

METALLIC FILMS;

EID: 0037016067     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(02)00348-8     Document Type: Article

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