Properties of amorphous Al-Yb alloy coating for scanning near-field optical microscopy tips

Journal of Applied Physics

Volumn 92, Issue 11, 2002, Pages 6895-6899

  Liang, Kai Feng ^a   Grutter P ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANNEALING; ATOMIC FORCE MICROSCOPY; COATINGS; ELECTRIC PROPERTIES; GLASS; GRAIN BOUNDARIES; MORPHOLOGY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL PROPERTIES; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION;

PINHOLES;

ALUMINUM ALLOYS;

EID: 0036906463     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1518762     Document Type: Article

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