Focused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy

Applied Physics Letters

Volumn 79, Issue 27, 2001, Pages 4494-4496

  Krogmeier, Jeffrey R ^a   Dunn, Robert C ^a  

^a UNIVERSITY OF KANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035981051     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1430028     Document Type: Article

References (9)

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6. E. J. Sanchez, L. Novotny, and X. S. Xie, Phys. Rev. Lett. 82, 4014 (1999).
7. S. Kawata and Y. Inouye, Ultramicroscopy 57, 313 (1995).
8. R. Eckert, J. M. Freyland, H. Gersen, H. Heinzelmann, G. Schurmann, W. Noell, U. Staufer, and N. F. De Rooij, Appl. Phys. Lett. 77, 3695 (2000).
9. C. E. Talley, G. Cooksey, and R. C. Dunn, Appl. Phys. Lett. 69, 3809 (1996).