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Volumn 42, Issue 12, 2002, Pages 1849-1855

Prediction of electromigration-void formation in copper conductors based on the electron configuration of matrix and solute atoms

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTORS; ELECTRONS; METALLIZING;

EID: 0036891283     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00101-4     Document Type: Article
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.