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Volumn 49 I, Issue 4, 2002, Pages 1978-1985

Optimization of front-end design in imaging and spectrometry applications with room temperature semiconductor detectors

Author keywords

Capacitive matching; Monolithic processes; Noise optimization

Indexed keywords

AMPLIFIERS (ELECTRONIC); CMOS INTEGRATED CIRCUITS; ELECTRODES; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS; OPTIMIZATION; SEMICONDUCTOR MATERIALS; SIGNAL DETECTION; SPECTROMETRY;

EID: 0036703071     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801703     Document Type: Article
Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.