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Volumn 465, Issue 1, 2001, Pages 166-175

30Mrad(SiO2) radiation tolerant pixel front end for the BTEV experiment

Author keywords

Deep submicron; Pixe; Radiation tolerance

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; READOUT SYSTEMS; SILICA; SILICON SENSORS;

EID: 0035365895     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00385-0     Document Type: Article
Times cited : (23)

References (11)
  • 10
    • 0033311541 scopus 로고    scopus 로고
    • Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: Practial design aspects
    • (1999) IEEE Trans. Nucl. Sci. , vol.NS-46 , pp. 1690
    • Anelli, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.