LHC1: A semiconductor pixel detector readout chip with internal, tunable delay providing a binary pattern of selected events

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 383, Issue 1, 1996, Pages 55-63

  Heijne, Erik H M ^a   Antinori, F ^a   Barberis, D ^d   Becks, K H ⁿ   Beker, H ^a   Beusch, W ^a   Burger, P ^o   Campbell, M ^a   Cantatore, E ^a,c   Catanesi, M G ^c   Chesi, E ^a   Darbo, G ^d   D'Auria, S ^g,j   DaVia', C ^a,j   Di Bari, D ^c   Di Liberto, S ^f   Gys, T ^a   Humpston, G ^p   Jacholkowski, A ^a   Jaeger J J ^h   Jakubek, J ^k   Jarron, P ^a   Klempt, W ^a   Krummenacher, F ^q   Knudson, K ^a   Kubasta, J ^k   Lassalle, J C ^a   Leitner, R ^k   Lemeilleur, F ^a   Lenti, V ^c   Letheren, M ^a   Lisowski, B ⁱ   Lopez, L ^a   Loukas, D ^b   Luptak, M ^l   Martinengo, P ^a   Meddeler, G ^a   Meddi, F ^f   Middelkamp, P ^a,n   Morando, M ^e   Morettini, P ^d   Munns, A ^p   Musico, P ^d   Pellegrini, F ^e   Pengg, F ^a   Pospisil, S ^k   Quercigh, E ^a   Ridky, J ^k   Rossi, L ^d   Safarik, K ^a   Scharfetter, L ^a   Segato, G ^e   Simone, S ^c   Smith, K ^j   Snoeys, W ^a   Sobczynski, C ^m   Stastny, J ^k   Vrba, V ^k   more..

^a CERN   (Switzerland)

^b NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

^c UNIVERSITY OF BARI   (Italy)

^d UNIVERSITY OF GENOA   (Italy)

^e UNIVERSITY OF PADOVA   (Italy)

^f INFN SEZIONE DI ROMA   (Italy)

^g UNIVERSITY OF UDINE   (Italy)

^h l'alimentation et l'Environnement   (France)

ⁱ TU DORTMUND UNIVERSITY   (Germany)

^j UNIVERSITY OF GLASGOW   (United Kingdom)

^k Group Praha   (Czech Republic)

^l INSTITUTE OF EXPERIMENTAL PHYSICS   (Slovakia)

^m UNIVERSITY OF WARSAW   (Poland)

ⁿ UNIVERSITY OF WUPPERTAL   (Germany)

^o Canberra NV Belgium   (Belgium)

^p GEC Marconi   (United Kingdom)

^q Smart Silicon Systems SA   (Switzerland)

more..

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); DELAY CIRCUITS; DISCRIMINATORS; INTEGRATED CIRCUIT TESTING; LOGIC DEVICES; READOUT SYSTEMS; SPURIOUS SIGNAL NOISE; THRESHOLD ELEMENTS; TRANSISTORS;

SEMICONDUCTOR PIXEL DETECTORS;

PARTICLE DETECTORS;

EID: 0030406084     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00658-4     Document Type: Article

References (7)

1. E.H.M. Heijne et al., IEEE Trans. Nucl. Sci. NS-42 (1995) 413.
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3. A. Jacholkowski et al., First results from experiment WA97, to be published in: Proc. Moriand '95, 19-25 March, Les Arcs, France.
4. E.H.M. Heijne et al., Nucl. Instr. and Meth. A 349 (1994) 138.
5. P. Middelkamp et al., Proc. 7th Europ. Symp. on Semiconductor Detectors, Schloss Elmau, Bavaria, Germany, May 7-10, 1995, Nucl. Instr. and Meth. A 377 (1996) 532.
6. M. Campbell, F. Antinori, H. Beker, W. Beusch, E. Chesi, E.H.M. Heijne, J. Heuser, P. Jarron, T. Karttaavi, L. Lopez, G. Meddeler, A. Menetrey, P. Middelkamp, C. Neyer, F. Pengg, M. Pindo, E. Quercigh, S. Simone and H. Verweij, Nucl. Instr. and Meth. A 342 (1994) 52.
7. F. Anghinolfi et al., IEEE Trans. Nucl. Sci. NS-39 (1992) 650.