Low Schottky barrier source/drain for advanced MOS architecture: Device design and material considerations

Solid-State Electronics

Volumn 46, Issue 7, 2002, Pages 997-1004

  Dubois, Emmanuel ^a   Larrieu, Guilhem ^a  

^a Institut Superieur de l'Electronique et du Numerique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEGRADATION; HOLE MOBILITY; SCHOTTKY BARRIER DIODES; SEMICONDUCTING FILMS; SILICON ON INSULATOR TECHNOLOGY;

SILICON-ON-INSULATOR (SOI) FILMS;

MOSFET DEVICES;

EID: 0036642907     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00033-3     Document Type: Conference Paper

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