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Volumn 41, Issue 16, 2002, Pages 3262-3269

Atomic-precision multilayer coating of the first set of optics for an extreme-ultraviolet lithography prototype system

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Indexed keywords


EID: 0036603505     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.003262     Document Type: Article
Times cited : (20)

References (18)
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  • 6
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    • High-performance Mo/Si and W/B4C multilayer mirrors for soft x-ray imaging optics
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    • (1994) J. X-Ray. Sci. Technol. , vol.4 , pp. 142-150
    • Gutman, G.1
  • 11
    • 0035535261 scopus 로고    scopus 로고
    • Multilayer coating and test of the optics for two new 10 X Microstepper extreme-ultraviolet lithography cameras
    • C. Montcalm, E. Spiller, F. J. Weber, S. Baker, M. Wedowski, and E. M. Gullikson, “Multilayer coating and test of the optics for two new 10 X Microstepper extreme-ultraviolet lithography cameras,” J. Vac. Sci. Technol. B. 19, 1219-1228 (2001).
    • (2001) J. Vac. Sci. Technol. B. , vol.19 , pp. 1219-1228
    • Montcalm, C.1    Spiller, E.2    Weber, F.J.3    Baker, S.4    Wedowski, M.5    Gullikson, E.M.6
  • 14
    • 0000022036 scopus 로고    scopus 로고
    • High-resolution, high flux, user friendly VLS beamline at the ALS for the 50-1300 eV energy region
    • J. H. Underwood and E. M. Gullikson, “High-resolution, high flux, user friendly VLS beamline at the ALS for the 50-1300 eV energy region,” J. Electron Spectrosc. Relat. Phenom. 92, 265-272 (1998).
    • (1998) J. Electron Spectrosc. Relat. Phenom. , vol.92 , pp. 265-272
    • Underwood, J.H.1    Gullikson, E.M.2
  • 16
    • 0027847392 scopus 로고
    • Masked deposition techniques for achieving multilayer period variations required for short-wavelength (68-A) soft-x-ray imaging optics
    • J. B. Kortright, E. M. Gullikson, and P. E. Denham, “Masked deposition techniques for achieving multilayer period variations required for short-wavelength (68-A) soft-x-ray imaging optics,” Appl. Opt. 32, 6961-6968 (1993).
    • (1993) Appl. Opt. , vol.32 , pp. 6961-6968
    • Kortright, J.B.1    Gullikson, E.M.2    Denham, P.E.3
  • 17
    • 0001070396 scopus 로고
    • Multilayer facilities required for extreme-ultraviolet lithography
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    • (1994) J. Vac. Sci. Tech-Nol. B , vol.12 , pp. 3826-3832
    • Windt, D.L.1    Waskiewicz, W.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.