Small particle adhesion: Measurement and control

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 165, Issue 1-3, 2000, Pages 11-23

  Mizes, Howard ^a   Ott, Mary ^a   Eklund, Elliott ^a   Hays, Dan ^a  

^a XEROX CORPORATION   (United States)

Author keywords

Adhesion; Atomic force microscopy; Centrifugal detachment; Particle; Xerography

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; PHOTOGRAMMETRY; SURFACE ROUGHNESS; XEROGRAPHY;

CENTRIFUGAL DETACHMENT; DIGITAL PHOTOGRAPHY; ELECTRIC FIELD DETACHMENT;

SURFACE PHENOMENA;

ADHESION; ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROL; MEASUREMENT; PARTICLE SIZE; PHYSICAL PARAMETERS; PRIORITY JOURNAL; XERORADIOGRAPHY;

EID: 0033972931     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(99)00442-2     Document Type: Article

References (25)

1. Schein L.B. Electrophotography and Development Physics. 1992;Springer, New York.
2. Scharfe M. Electrophotography Principles and Optimization. 1984;Wiley, New York.
3. Pai D.M., Springett B.E. Rev. Mod. Phys. 65:1993;163.
4. Gruber R., Julien P. Dry toner technology. Diamond A. Handbook of Imaging Materials. 1991;Marcel Dekker, New York.
5. Burnham N.A., Colton R.J., Pollock H.M. Interpretation of force curves in force microscopy. Nanotechnol. 4:1993;64-80.
6. Schaefer D.M., Carpenter M., Gady B., Reifenberger R., DeMejo L.P., Rimai D.S. J. Adhesion Sci. Technol. 8:1994;197.
7. Schaefer D.M., Carpenter M., Gady B., Reifenberger R., DeMejo L.P., Rimai D.S. J. Adhesion Sci. Technol. 9:1995;1049.
8. Schaefer D.M., Carpenter M., Gady B., Reifenberger R., DeMejo L.P., Rimai D.S. Rimai D.S., DeMejo L.P., Mittal K.L. Fundamentals of Adhesion and Interfaces. 1995;35-48 VSP, Utrecht, The Netherlands.
9. Donald D.K. J. Appl. Phys. 40:1969;3013.
10. Donald D.K. J. Adhesion. 4:1972;233.
11. St.John D.F., Montgomery D.J. J. Appl. Phys. 42:1971;663.
12. Mastrangelo C.J. Photogr. Sci. Eng. 26:1982;195.
13. Eklund E.A., Wayman W.H., Brillson L.J., Hays D.A. Proceedings of the IS&T tenth international congress on advanc0es in non-impact printing technologies. 1994;142.
14. Gady B., Schleef D., Reifenberger R., Rimai D., DeMejo L.P. Phys. Rev. B. 53:1996;8065.
15. Mizes H.A. J. Adhesion Sci. Technol. 8:1994;937.
16. Ott M.L., Mizes H.A. Colloids Surf. A87:1994;245.
17. Israelachvili J. Intermolecular and Surface Forces. 2nd edition:1992;161-164 Academic Press, New York.
18. Johnson K.L., Kendall K., Roberts A.D. Proc. Roy. Soc. London, A. 342:1971;301.
19. Mizes H.A. J. Adhesion. 51:1995;155.
20. Mizes H.A. Ward T. Proceedings of the 19th annual meeting of the adhesion society. 1995;318.
21. Gady B., Quesnel D.J., Rimai D.S., Leone S., Alexandrovich P. J. Imag. Sci. Technol. 43:1998;288.
22. Hays D.A. J. Adhesion Sci. Technol. 9:1995;1063.
23. Hays D.A. Mittal K.L. Particles on Surfaces 1: Detection, Adhesion and Removal. 1988;351-360 Plenum Press, New York.
24. Christy O.D. IS&T Proc., 11th Int. Cong. on Non-Impact Printing. 1995;176-179 IS&T, Springfield, VA.
25. Goel N., Spencer P. Lee L.H. Adhesion Science and Technology. 1975;763 Plenum Press, New York.