Effect of wettability on adhesion force between silica particles evaluated by atomic force microscopy measurement as a function of relative humidity

Langmuir

Volumn 15, Issue 13, 1999, Pages 4584-4589

  Fuji, Masayoshi ^a   Machida, Kotoe ^a   Takei, Takashi ^a   Watanabe, Tohru ^a   Chikazawa, Masatoshi ^a  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; FORCE MEASUREMENT; HYDROGEN BONDS; HYDROPHOBICITY; HYDROXYLATION; PARTICLES (PARTICULATE MATTER); SILICA; SURFACE TENSION; SURFACE TREATMENT; WETTING;

ADHESION FORCE; HEXAMETHYLDISILAZANE; REHYDROXYLATION; WETTABILITY;

ADHESION;

EID: 0032634401     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la981533c     Document Type: Article

References (2)

1. Fridrun, P.; Michael, N. J.; Michael, B. J. Int. J. Pharm. 1996, 145, 221.
2. Harnby, N.; Hawkins, A. E.; Opalinski, I. Trans Inst. Chem. Eng. 1996, 74, 605.