SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Non-Crystalline Solids

Volumn 299-302, Issue PART 2, 2002, Pages 1316-1320

CMOS polycrystalline silicon circuits on steel substrates

(2) Wu, Ming a Wagner, Sigurd a

a Princeton University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; ELECTRON MOBILITY; HOLE MOBILITY; POLYSILICON; STEEL; SUBSTRATES; THIN FILM TRANSISTORS;

POLYSILICON FILMS;

CMOS INTEGRATED CIRCUITS;

EID: 0036531549 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3093(01)01153-X Document Type: Article

Times cited : (3)

References (20)

1
- 0003828898
- World Scientific, Singapore
- (2000) Selected Topics in Electronics and Systems , vol.18
- Lumelsky, V.¹ Shur, M.S.² Wagner, S.³

2
- 0033607992
- (1999) Proc. SPIE - Int. Soc. Opt. Eng. , vol.3636 , pp. 4
- Carey, P.G.¹ Smith, P.M.² Theiss, S.D.³ Wickboldt, P.⁴ Sigmon, T.W.⁵

3
- 0030422378
- (1997) Mater. Res. Soc. Symp. Proc. , vol.424 , pp. 65
- Theiss, S.D.¹ Wagner, S.²

4
- 0032595848
- (1999) IEEE Electron. Dev. Lett. , vol.20 , pp. 473
- Gleskova, H.¹ Wagner, S.²

5
- 0000428530
- (2001) Tech. Dig. Soc. Inf. Disp. , vol.32 , pp. 157
- Chen, Y.¹ Denis, K.² Kazlas, P.³ Drzaic, P.⁴

6
- 33747286911
- (1988) J. Appl. Phys. , vol.63 , pp. 2260
- Hatalis, M.K.¹ Greve, D.W.²

7
- 36549103626
- (1989) J. Appl. Phys. , vol.65 , pp. 2069
- Kakkad, R.¹ Smith, J.² Lau, W.S.³ Fonash, S.J.⁴

8
- 0022719826
- (1986) IEEE Electron Dev. Lett. , vol.7 , pp. 276
- Sameshima, T.¹ Usui, S.² Sekiya, M.³

9
- 0032651727
- (1999) Mater. Res. Soc. Symp. Proc. , vol.507 , pp. 3
- Mei, P.¹ Boyce, J.B.² Fork, D.K.³ Anderson, G.⁴ Ho, J.⁵ Lu, J.⁶ Hack, M.⁷ Lujan, R.⁸

10
- 0033221991
- (1999) IEEE Electron Dev. Lett. , vol.20 , pp. 574
- Serikawa, T.¹ Omata, F.²

11
- 0006218313
- (2000) Mater. Res. Soc. Symp. Proc. , vol.609
- Wu, M.¹ Wagner, S.²

12
- 0029546405
- (1995) Mater. Res. Soc. Symp. Proc. , vol.377 , pp. 871
- Moffat, D.M.¹

13
- 0034986297
- (2001) J. Soc. Inf. Disp. , vol.9 , pp. 19
- Fehlner, F.P.¹

14
- 0034140186
- (2000) IEEE Electron Dev. Lett. , vol.21 , pp. 70
- Howell, R.S.¹ Stewart, M.² Karnik, S.V.³ Saha, S.K.⁴ Hatalis, M.K.⁵

15
- 4244017964
- (1999) Tech. Dig. IEDM , vol.119
- Wu, M.¹ Pangal, K.² Sturm, J.C.³ Wagner, S.⁴

16
- 33747286911
- (1988) J. Appl. Phys. , vol.63 , pp. 2260
- Hatalis, M.K.¹ Greve, D.W.²

17
- 0028381651
- (1994) IEE Proc. - Circuits Dev. Syst. , vol.141 , pp. 15
- Dryer, T.E.¹ Marshall, J.M.² Pickin, W.³ Hepburn, A.R.⁴ Davies, J.F.⁵

18
- 0028375101
- (1994) IEE Proc. - Circuits Dev. Syst. , vol.141 , Issue.1 , pp. 50
- Edwards, M.J.¹

19
- 0034251092
- (2000) IEEE Trans. Electron Devices , vol.47 , pp. 1599
- Pangal, K.¹ Sturm, J.C.² Wagner, S.³ Yao, N.⁴

20
- 4244160143
- (2001) Mater. Res. Soc. , vol.664
- Wu, M.¹ Wagner, S.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.