Amorphous silicon TFTs on steel-foil substrates

Materials Research Society Symposium - Proceedings

Volumn 424, Issue , 1996, Pages 65-70

  Theiss, S D ^a   Wagner, S ^a  

^a PRINCETON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; FILM GROWTH; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS; METAL FOIL; SEMICONDUCTOR DEVICE STRUCTURES; STAINLESS STEEL; SUBSTRATES;

SATURATION CURRENT; STAINLESS STEEL FOILS;

THIN FILM TRANSISTORS;

EID: 0030422378     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-424-65     Document Type: Conference Paper

References (5)