Low cost PC based scanning Kelvin probe

Review of Scientific Instruments

Volumn 69, Issue 11, 1998, Pages 3902-3907

  Baikie, I D ^a,b   Estrup, P J ^b  

^a MARINE BIOLOGICAL LABORATORY   (United States)

^b BROWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001731571     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149197     Document Type: Article

References (41)

1. I. D. Baikie, Ph.D. thesis, University of Twente, 1988, ISBN 90-9002444-1.
2. I. D. Baikie, Mater. Res. Soc. Symp. Proc. 204, 363 (1991).
3. I. D. Baikie, A. Speakman, and U. Petermann, Surf. Sci. (submitted).
4. J. Janata, Anal. Chem. 63, 2546 (1991).
5. E. Kopatzhi, H.-G. Keck, I. D. Baikie, J. A. Meyer, and R. J. Behm, Surf. Sci. 345, L11 (1996).
6. J. A. Meyer, I. D. Baikie, E. Kopatzki, and R. J. Behm, Surf. Sci. 345, L647 (1996).
7. I. D. Baikie, Mater. Res. Soc. Symp. Proc. 259, 149 (1992).
8. B. Lagel, I. D. Baikie, and U. Petermann, Mater. Res. Soc. Symp. Proc. 510, 619 (1998).
9. G. H. Bruggink and I. D. Baikie, Proceedings of the 2nd International Conference on the Ultra Clean Processing of Silicon Surfaces, Brugge, 1994, pp. 193-196.
10. I. D. Baikie, E. Venderbosh, and B. Hall, Mater. Res. Soc. Symp. Proc. 261, 149 (1992).
11. C. G. Vayenas, S. Bebelis, and S. Ladas, Nature (London) 345, 625 (1990).
12. C. A. Domenicali, Rev. Mod. Phys. 26, 237 (1954).
13. C. Herring and M. H. Nicols, Rev. Mod. Phys. 21, 185 (1949).
14. C. Curesh Kumar, A. Subrahmanyam, and J. Majhi, Rev. Sci. Instrum. 67, 805 (1996).
15. I. D. Baikie, K. O. van der Werf, J. Broeze, and A. van Silfhout, Rev. Sci. Instrum. 60, 930 (1989).
16. Y. Petit-Clerc and J. D. Carette, Vacuum 18, 7 (1968).
17. T. Fort and R. G. Wells, Surf. Sci. 12, 46 (1968).
18. Lord Kelvin, Philos. Mag. 46, 82 (1898).
19. W. A. Zisman, Rev. Sci. Instrum. 3, 367 (1932).
20. B. Ritty, F. Wachtel, R. Manquenouille, F. Ott, and J. B. Donnet, J. Phys. E 15, 310 (1982).
21. I. D. Baikie, S. Mackenzie, P. J. Estrup, and J. A. Meyer, Rev. Sci. Instrum. 62, 1326 (1991).
22. L. B. Harris and J. Fiasson, J. Phys. E 17, 788 (1984).
23. H. Baumgartner and H. D. Leiss, Rev. Sci. Instrum. 59, 802 (1988).
24. K. Besocke and S. Berger, Rev. Sci. Instrum. 47, 840 (1976).
25. S. Saito, T. Soumura, and T. Madea, J. Vac. Sci. Technol. A 2, 1389 (1984).
26. K. Germanov, Ch. Hardalov, V. Strashilov, and B. Georgoev, J. Phys. E 20, 273 (1987).
27. This is particularly true in the UHV environment where shielding issues make it very difficult to eliminate driver talkover.
28. N. Nonnemacher, M. P. O'Boyle, and H. K. Wickramashinghe, Appl. Phys. Lett. 58, 2921 (1991).
29. M. O'Boyle (private communication).
30. I. D. Baikie, E. Venderbosch, J. A. Meyer, and P. J. Estrup, Rev. Sci. Instrum. 62, 725 (1991).
31. W. Nabhan and G. De Rosny, Rev. Sci. Instrum. 68, 3108 (1997).
32. W. Nabhan, A. Broniatowski, G. De Rosny, and B. Equer, Microsc. Microanal. Microstruct. 5, 509 (1994).
33. User interface is written in Delphi 1 for Windows 3.1 and Win 95 Operating Systems.
34. I. D. Baikie, U. Petermann, and B. Lagel, Surf. Sci. (submitted).
35. I. D. Baikie (unpublished).
36. I. D. Baikie, K. O. van der Werf, and L. J. Hanekamp, Rev. Sci. Instrum. 59, 2075 (1988).
37. The generalized Kelvin circuit solution can be found in Refs. 2 and 21.
38. Further topographies are available for inspection at http://www.rgu.ac.uk/ subj/skpg.
39. R. C. Weast, CRC Handbook of Chemistry and Physics, 73rd ed. (Chemical Rubber, Boca Raton, FL, 1986).
40. Al and Au wf data were determined using photoemission and that of Zn was obtained using a CPD method.
41. I. D. Baikie and G. H. Bruggink, Mater. Res. Soc. Symp. Proc. 309, 35 (1993).