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1
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0012098939
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Thermal analysis of a substrate with power dissipation in the vias
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October
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R.A. Brewster and R.A. Sherif, "Thermal Analysis of a Substrate with Power Dissipation in the Vias" Tans. IEEE, Vol. 15, No. 5, pp. 667-674, October 1992.
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(1992)
Tans. IEEE
, vol.15
, Issue.5
, pp. 667-674
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Brewster, R.A.1
Sherif, R.A.2
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2
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0012040150
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Performance characterization of thermal vias
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EEP
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S. Song, S. Muegge, and V. Au, "Performance Characterization of Thermal Vias," ASME Electric & Electronic Packaging Division, EEP-Vol. 19-2, pp. 2123-2130, 1997.
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(1997)
ASME Electric & Electronic Packaging Division
, vol.19
, Issue.2
, pp. 2123-2130
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Song, S.1
Muegge, S.2
Au, V.3
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3
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0026810890
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Analysis of thermal vias in high density interconnect technology
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S. Lee, T.F. Lemczyk, and M.M. Yovanovich, "Analysis of Thermal Vias in High Density Interconnect Technology," Proc. Eight IEEE SEMI-THERM Symp., pp. 55-61, 1992.
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(1992)
Proc. Eight IEEE SEMI-THERM Symp.
, pp. 55-61
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Lee, S.1
Lemczyk, T.F.2
Yovanovich, M.M.3
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4
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0030813292
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Thermal sub-modeling of wirebonded plastic ball grid array package
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Sponsored by IEEE CPMT. Soc. January 27-28, Austin, TX
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Z.E. Johnson, K. Ramakrishna, B. Joiner, and L.M. Eyman, "Thermal Sub-Modeling of Wirebonded Plastic Ball Grid Array Package," Proc. of Thirteenth Annual IEEE Symp., pp. 1-9, Sponsored by IEEE CPMT. Soc. January 27-28, 1997, Austin, TX.
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(1997)
Proc. of Thirteenth Annual IEEE Symp.
, pp. 1-9
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Johnson, Z.E.1
Ramakrishna, K.2
Joiner, B.3
Eyman, L.M.4
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5
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0002784474
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Parametric study of thermal performance of a three chip, single package technology for automotive applications
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"CAD/CAKE and Thermal Management Issues in Electronic Systems" D. Agonafer et. al. (editor), ASME Electrical & Electronic Packaging Division, EEP & HTD, ASME, November 16-21, Dallas, TX; accepted for publication in J. of Electronic Packaging
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K. Ramakrishna and J.R. Trent, "Parametric Study of Thermal Performance of a Three Chip, Single Package Technology for Automotive Applications," in "CAD/CAKE and Thermal Management Issues in Electronic Systems" D. Agonafer et. al. (editor), ASME Electrical & Electronic Packaging Division, pp. 13-21, EEP-Vol. 23 & HTD-Vol. 356, ASME International Mechanical Engineering Conference & Exposition, November 16-21, 1997, Dallas, TX; accepted for publication in J. of Electronic Packaging.
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(1997)
International Mechanical Engineering Conference & Exposition
, vol.23
, Issue.356
, pp. 13-21
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Ramakrishna, K.1
Trent, J.R.2
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6
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0031620446
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Thermal performance of a ball grid array single package technology solution under natural and forced convection cooling
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S.H. Bhavnani, G.B. Kromann & D.J. Nelson (editors), sponsored by IEEE CPMT Soc., May 27-30, Seattle, WA
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K. Ramakrishna, T.R. Thomas, T.Y. Lee, J.R. Trent, and J.V. Hause, "Thermal Performance of a Ball Grid Array Single Package Technology Solution under Natural and Forced Convection Cooling," Proc. Of ITHERM 1998 -Sixth Intersociety Conference on Thermal and Thermo-mechanical Phenomena in Electronic Systems, S.H. Bhavnani, G.B. Kromann & D.J. Nelson (editors), pp. 27-34, sponsored by IEEE CPMT Soc., May 27-30, 1998, Seattle, WA.
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(1998)
Proc. Of ITHERM 1998 -Sixth Intersociety Conference on Thermal and Thermo-mechanical Phenomena in Electronic Systems
, pp. 27-34
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Ramakrishna, K.1
Thomas, T.R.2
Lee, T.Y.3
Trent, J.R.4
Hause, J.V.5
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7
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0033295470
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Impact of on-die discrete heating on thermal performance characteristics of silicon based IC electronic packages
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"Electronics Manufacturing Issues," C. Sahay, B. Sammakia, I. Kao, & D. Baldwin (editors), Nashville, TN, November 14-19, ASME
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V.H. Adams and K. Ramakrishna, "Impact of On-Die Discrete Heating on Thermal Performance Characteristics of Silicon Based IC Electronic Packages," "Electronics Manufacturing Issues," C. Sahay, B. Sammakia, I. Kao, & D. Baldwin (editors), Proc. of the 1999 ASME IMECE, Nashville, TN, November 14-19, 1999, ASME Vol. EEP-Vol. 104, pp. 99-106.
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(1999)
Proc. of the 1999 ASME IMECE
, vol.104 EEP
, pp. 99-106
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Adams, V.H.1
Ramakrishna, K.2
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8
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0346402824
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Design based performance evaluation of a GaAs MMIC device in a PBGA package
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"Adv. In Electronic Packaging 1999," (Maul, H.I., June 13-19), D. Aganofer, M. Saka, & Y.C. Lee (editors), ASME
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V.H. Adams, K. Ramakrishna, T.Y.T. Lee, V. Hause, and M. Mahalingam, "Design Based Performance Evaluation of a GaAs MMIC Device in a PBGA Package," in "Adv. In Electronic Packaging 1999," Proc. of Pacific Rim/ASME Intl. Intersociety Electronic & Photonic Convf. (Maul, H.I., June 13-19, 1999), D. Aganofer, M. Saka, & Y.C. Lee (editors), ASME Vol. 26-1, pp. 277-286.
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(1999)
Proc. of Pacific Rim/ASME Intl. Intersociety Electronic & Photonic Convf.
, vol.26
, Issue.1
, pp. 277-286
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Adams, V.H.1
Ramakrishna, K.2
Lee, T.Y.T.3
Hause, V.4
Mahalingam, M.5
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9
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0039335317
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Thermal assessment and enhancement of molded array (MAP) PBGA packages for handheld telecommunication applications
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November, held in Orlando, Fl
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V.H. Adams, V. Chiriac, and T.Y. Lee, "Thermal Assessment and Enhancement of Molded Array (MAP) PBGA Packages for Handheld Telecommunication Applications," Presented at the 2000 ASME IMECE, November 2000, held in Orlando, Fl.
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(2000)
The 2000 ASME IMECE
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Adams, V.H.1
Chiriac, V.2
Lee, T.Y.3
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10
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0032641939
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Thermal design for flip chip on board in natural convection
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Sponsored by IEEE CPMT. Soc. March 9-11, San Diego, CA
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C.-B. Hwang, "Thermal Design for Flip Chip on Board in Natural Convection," Proc. Fifteenth Annual IEEE Semiconductor Thermal Measurement (SEMI-THERM) Syump, p. 125-132, Sponsored by IEEE CPMT. Soc. March 9-11, 1999, San Diego, CA.
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(1999)
Proc. Fifteenth Annual IEEE Semiconductor Thermal Measurement (SEMI-THERM) Syump
, pp. 125-132
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Hwang, C.-B.1
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11
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0003548126
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EIA/JESD51-9, Electronic Industries Association, Engineering Department, July, Arlington, VA
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EIA/JESD51-9, "Test Boards for Area Array Surface Mount Package Thermal Measurements," Electronic Industries Association, Engineering Department, July 2000, Arlington, VA.
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(2000)
Test Boards for Area Array Surface Mount Package Thermal Measurements
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-
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12
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0004192831
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EIA/JESD51-6, Electronic Industries Association, Engineering Department, July, Arlington, VA
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EIA/JESD51-6, "Integrated Circuit Thermal Test Method Environmental Conditions Forced Convection (Moving Air)," Electronic Industries Association, Engineering Department, July 2000, Arlington, VA.
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(2000)
Integrated Circuit Thermal Test Method Environmental Conditions Forced Convection (Moving Air)
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