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Volumn 104, Issue , 1999, Pages 99-106

Impact of on-die discrete heating on thermal performance characteristics of silicon based IC electronic packages

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EMBEDDED SYSTEMS; HEAT TRANSFER; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; SEMICONDUCTING SILICON; THERMAL CONDUCTIVITY;

EID: 0033295470     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (12)

References (17)
  • 2
    • 0342811713 scopus 로고    scopus 로고
    • Semiconductor device temperature measurements using electrical parameters
    • Blackburn, D., 1998, "Semiconductor Device Temperature Measurements Using Electrical Parameters," Future Circuits International, Issue 4, pp. 75-83.
    • (1998) Future Circuits International , Issue.ISSUE 4 , pp. 75-83
    • Blackburn, D.1
  • 3
    • 0029490378 scopus 로고
    • Achieving accurate thermal characterization using a CFD code - A case study of plastic packages
    • Burgos, J., Manno, V., and Azar, K., 1995, "Achieving Accurate Thermal Characterization Using a CFD Code - A Case Study of Plastic Packages," IEEE Trans. Components Packaging, and Manufacturing Tech., Part B, V. 18, pp. 732-738.
    • (1995) IEEE Trans. Components Packaging, and Manufacturing Tech. , vol.18 , Issue.PART B , pp. 732-738
    • Burgos, J.1    Manno, V.2    Azar, K.3
  • 5
    • 0003711924 scopus 로고    scopus 로고
    • Purdue University, West Lafayette, IN
    • CINDAS Material Property Database, 1997, Purdue University, West Lafayette, IN.
    • (1997) CINDAS Material Property Database
  • 6
    • 0343682011 scopus 로고    scopus 로고
    • Comparison of finite-difference and SPICE tools for thermal modeling of the effects of nonuniform power generation in high-power CPUs
    • Denney, J. and Ramsey, C., 1998, "Comparison of Finite-Difference and SPICE Tools for Thermal Modeling of the Effects of Nonuniform Power Generation in High-Power CPUs," The Hewlett-Packard Journal (http:/www.hp.com/hpj/journal.html), V. 50, pp. 37-45.
    • (1998) The Hewlett-Packard Journal , vol.50 , pp. 37-45
    • Denney, J.1    Ramsey, C.2
  • 9
    • 0142016746 scopus 로고
    • Document number: FLOTHERM/RM/0394/1/3, version 1.4 (36), Flomerics Ltd., Surrey, England
    • Flotherm Reference Manual, V1.4, 1995, Document number: FLOTHERM/RM/0394/1/3, version 1.4 (36), Flomerics Ltd., Surrey, England.
    • (1995) Flotherm Reference Manual, V1.4
  • 11
    • 0010688156 scopus 로고    scopus 로고
    • Junction-to-board thermal resistance and its use in thermal modeling
    • San Diego, CA, March 1999
    • Joiner, B. and Adams, V., 1999, "Junction-to-Board Thermal Resistance and Its Use in Thermal Modeling," Proc. Fifteenth IEEE Semi-Therm Symp., San Diego, CA, March 1999.
    • (1999) Proc. Fifteenth IEEE Semi-Therm Symp.
    • Joiner, B.1    Adams, V.2
  • 14
    • 0002784474 scopus 로고    scopus 로고
    • Parametric study of thermal performance of a three chip, single package technology for automotive applications
    • "CAD/CAE and Thermal Management Issues in Electronic Systems" D. Agonafer, (editor), ASME Electrical & Electronic Packaging Division, TX (November 16-21, 1997)
    • Ramakrishna, K., and Trent, J. R., 1997, "Parametric Study of Thermal Performance of a Three Chip, Single Package Technology for Automotive Applications," in "CAD/CAE and Thermal Management Issues in Electronic Systems" D. Agonafer, (editor), ASME Electrical & Electronic Packaging Division, pp. 13-21, EEP-Vol. 23 & HTD-Vol. 356, Presented at the 1997 ASME International Mechanical Engineering Conference & Exposition held in Dallas, TX (November 16-21, 1997).
    • (1997) 1997 ASME International Mechanical Engineering Conference & Exposition Held in Dallas , vol.23-356 , pp. 13-21
    • Ramakrishna, K.1    Trent, J.R.2
  • 17
    • 0027591164 scopus 로고
    • Thermal modeling of power gallium arsenside microwave integrated circuits
    • Webb, P., 1993, "Thermal Modeling of Power Gallium Arsenside Microwave Integrated Circuits," IEEE Trans. Electron Devices, V. 40, pp. 867-877.
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 867-877
    • Webb, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.