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Volumn , Issue , 1992, Pages

Fault model evolution for diagnosis: Accuracy vs precision

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY AND PRECISION; BRIDGING FAULT; FAULT MODEL; VOTING MODEL;

EID: 84869995409     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.1992.591298     Document Type: Conference Paper
Times cited : (39)

References (26)
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  • 6
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  • 7
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    • Development of Logic Level CMOS Bridging Fault Models
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  • 12
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  • 13
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    • Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability
    • June
    • Galiay, J., Y. Crouzet, and M. Vergniault, "Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability," IEEE Trans. Comput., Vol. C-29, No. 6, June 1980, pp. 527-531.
    • (1980) IEEE Trans. Comput. , vol.C-29 , Issue.6 , pp. 527-531
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  • 15
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  • 20
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  • 24
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.