Logic mapping on a microprocessor

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 701-710

  Kinra, Anjali ^a   Balachandran, Hari ^a   Thomas, Regy ^a   Carulli, John ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER AIDED DIAGNOSIS; FAILURE ANALYSIS; INTEGRATION; LOGIC DESIGN; MATHEMATICAL TECHNIQUES; MICROPROCESSOR CHIPS; ONLINE SYSTEMS;

DEFECT INSPECTION; FAILING BITS; LOGIC MAPPING; SCAN BASED DIAGNOSIS; STANDARD MEMORY DEBUG TECHNIQUES;

COMPUTER DEBUGGING;

EID: 0034484260     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)