YIELD DIAGNOSIS THROUGH INTERPRETATION OF TESTER DATA.

Digest of Papers - International Test Conference

Volumn , Issue , 1987, Pages 10-20

  Maly, Wojciech ^a   Trifilo, Bonnie ^a   Hughes, Randall A ^a   Miller, Alfred ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; COMPUTER AIDED MANUFACTURING - PRODUCTIVITY;

FUNCTIONAL TESTS DATA EXTRACTION; TEST STRUCTURE MEASUREMENTS; TESTER DATA INTERPRETATION; YIELD DIAGNOSIS; YIELD LOSSES SYSTEMATIC ANALYSIS;

INTEGRATED CIRCUITS, VLSI;

EID: 0023561932     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)