Failure analysis for full-scan circuits

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 636-645

  De, Kaushik ^a   Gunda, Arun ^a  

^a AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; DEFECTS; ELECTRON BEAMS; FAILURE ANALYSIS; ITERATIVE METHODS; MATHEMATICAL MODELS; SEQUENTIAL CIRCUITS;

DEFECTIVE PARTS; FULL SCAN CIRCUITS; STATIC CURRENT MONITORING; STUCK AT FAULT MODEL;

INTEGRATED CIRCUITS;

EID: 0029519360     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)