Yield learning via functional test data

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 626-635

  Kwon, Young Jun ^a   Walker, D M H ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC CURRENTS; LEARNING SYSTEMS; MATHEMATICAL MODELS; MONITORING; PROBABILITY; RANDOM ACCESS STORAGE;

FUNCTIONAL YIELD MONITORING; HISTOGRAM; PARETO ACCURACY; RAPID YIELD LEARNING; TEST STRUCTURES;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0029489291     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (46)