Energy dispersive spectroscopy analysis of aluminium segregation in silicon carbide grain boundaries

Journal of Microscopy

Volumn 207, Issue 1, 2002, Pages 58-68

  Zhang, X F ^a   Yang, Q ^a   De Jonghe, L C ^a   Zhang, Z ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Beijing Laboratory of Electron Microscopy   (China)

Author keywords

Al; Energy dispersive spectroscopy; Grain boundary; Impurity; SiC; Transmission electron microscopy

Indexed keywords

ALUMINUM COMPOUNDS; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SEGREGATION (METALLOGRAPHY); SILICON CARBIDE; SPECTRUM ANALYSIS;

AL; AL ADDITIONS; ALUMINUM ADDITIVE; BORON AND CARBONS; FOIL THICKNESS; GRAIN BOUNDARY FILMS; GRAIN-BOUNDARIES; INTERGRANULAR FILMS; POLYCRYSTALLINE SIC; SIC GRAINS;

GRAIN BOUNDARIES;

ALUMINUM; BORON; CARBON; CRYSTALLIN; SILICON CARBIDE;

ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; CALIBRATION; CONCENTRATION (PARAMETERS); DISPERSION; DISSOLUTION; ELECTRON BEAM; ENERGY; FILM; FOIL; GRAIN; PARAMETER; PARTICLE SIZE; PRIORITY JOURNAL; ROENTGEN SPECTROSCOPY; STATISTICAL ANALYSIS; THEORY; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036372877     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2002.01034.x     Document Type: Article

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