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Volumn 46, Issue 2, 1998, Pages 481-490

Chemistry and bonding changes associated with the segregation of Bi to grain boundaries in Cu

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; EMBRITTLEMENT; GRAIN BOUNDARIES; SEGREGATION (METALLOGRAPHY);

EID: 0032484331     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(97)00262-0     Document Type: Article
Times cited : (39)

References (55)
  • 44
    • 0343951439 scopus 로고    scopus 로고
    • ed. G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael and N. J. Zaluzec. San Francisco Press, San Francisco
    • Bruley, J. and Williams, D. B., in Proc. Microscopy and Microanalysis 1996, ed. G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael and N. J. Zaluzec. San Francisco Press, San Francisco 1996, p. 564.
    • (1996) Proc. Microscopy and Microanalysis 1996 , pp. 564
    • Bruley, J.1    Williams, D.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.