Quantification of boundary segregation in the electron microscope

Journal of Microscopy

Volumn 199, Issue 1, 2000, Pages 45-55

  Keast, V J ^a   Williams, D B ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b Lehigh University   (United States)

Author keywords

Analytical electron microscopy; Grain boundaries; Interaction volume; Segregation; XEDS

Indexed keywords

ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; PROBES; SEGREGATION (METALLOGRAPHY); TRANSMISSION ELECTRON MICROSCOPY;

ANALYTICAL ELECTRON MICROSCOPY; BOUNDARY SEGREGATION; ELECTRON PROBE; EQUILIBRIUM GRAIN-BOUNDARY SEGREGATIONS; GRAIN-BOUNDARIES; INTERACTION VOLUME; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SEGREGATION; SEGREGATION LEVELS; XEDS;

GRAIN BOUNDARIES;

ACCURACY; ANALYTIC METHOD; DIAGNOSTIC IMAGING; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; PRIORITY JOURNAL; QUANTITATIVE ASSAY; RADIATION DETECTION; REVIEW; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS;

EID: 0033921025     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2000.00694.x     Document Type: Review

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