Controlling interface chemistry and structure to process and toughen silicon carbide

Acta Materialia

Volumn 46, Issue 7, 1998, Pages 2471-2477

  Moberlychan, W J ^a   De Jonghe, L C ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIVES; AUGER ELECTRON SPECTROSCOPY; BRITTLENESS; CERAMIC MATERIALS; CRYSTAL MICROSTRUCTURE; DENSITY (SPECIFIC GRAVITY); ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; SURFACE CHEMISTRY; TOUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS FILTERED IMAGING; HIGH RESOLUTION LATTICE IMAGING; INTERFACIAL MOTION;

SILICON CARBIDE;

EID: 0032036295     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)80030-X     Document Type: Article

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