-
1
-
-
36849098287
-
Rapid reversible light-induced crystallization of amorphous semiconductors
-
J. Feinleib, J. de Nuerville, S. C. Moss, and S. R. Ovshinsky, “Rapid reversible light-induced crystallization of amorphous semiconductors, ” Appl. Phys. Lett. 18, 254-257 (1971).
-
(1971)
Appl. Phys. Lett.
, vol.18
, pp. 254-257
-
-
Feinleib, J.1
De Nuerville, J.2
Moss, S.C.3
Ovshinsky, S.R.4
-
2
-
-
84945449019
-
High speed overwritable phase change optical disk material
-
N. Yamada, E. Ohno, N. Akahira, K. Nishiuchi, K. Nagata, and M. Takeo, “High speed overwritable phase change optical disk material, ” Jpn. J. Appl. Phys. Suppl. 26-4, 61-66 (1987).
-
(1987)
Jpn. J. Appl. Phys. Suppl.
, vol.26
, Issue.4
, pp. 61-66
-
-
Yamada, N.1
Ohno, E.2
Akahira, N.3
Nishiuchi, K.4
Nagata, K.5
Takeo, M.6
-
3
-
-
84956089394
-
Phase-change disk media having rapid cooling structure
-
T. Ohta, K. Inoue, M. Uchida, K. Yoshioka, T. Akiyama, S. Furukawa, K. Nagata, and S. Nakamura, “Phase-change disk media having rapid cooling structure, ” Jpn. J. Appl. Phys. Suppl. 28-3, 123-128 (1989).
-
(1989)
Jpn. J. Appl. Phys. Suppl.
, vol.28
, Issue.3
, pp. 123-128
-
-
Ohta, T.1
Inoue, K.2
Uchida, M.3
Yoshioka, K.4
Akiyama, T.5
Furukawa, S.6
Nagata, K.7
Nakamura, S.8
-
4
-
-
0000648987
-
Measurement of the thermal conductivity of the erasable phase-change optical recording media
-
C. Peng and M. Mansuripur, “Measurement of the thermal conductivity of the erasable phase-change optical recording media, ” Appl. Opt. 39, 2347-2352 (2000).
-
(2000)
Appl. Opt.
, vol.39
, pp. 2347-2352
-
-
Peng, C.1
Mansuripur, M.2
-
5
-
-
0033319042
-
High data-rate phase-change media for the digital video recording system
-
S. Kubota, R. Katayama, and D. G. Stinson, eds., Proc. SPIE
-
B. Tieke, M. Dekker, N. Pfeffer, R. van Woudenberg, G. F. Zhou, and I. P. D. Ubbens, “High data-rate phase-change media for the digital video recording system, ” in Joint International Symposium on Optical Memory and Optical Data Storage, 1999, S. Kubota, R. Katayama, and D. G. Stinson, eds., Proc. SPIE 3864, 200-202 (1999).
-
(1999)
Joint International Symposium on Optical Memory and Optical Data Storage, 1999
, vol.3864
, pp. 200-202
-
-
Tieke, B.1
Dekker, M.2
Pfeffer, N.3
Van Woudenberg, R.4
Zhou, G.F.5
Ubbens, I.P.D.6
-
7
-
-
5644255920
-
Heat capacity measurements of Sn nanostructures using a thin film differential scanning calorimeter with 0.2 nJ sensitivity
-
S. L. Lai, G. Ramanath, L. H. Allen, and P. Infante, “Heat capacity measurements of Sn nanostructures using a thin film differential scanning calorimeter with 0.2 nJ sensitivity, ” Appl. Phys. Lett. 70, 43-45 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 43-45
-
-
Lai, S.L.1
Ramanath, G.2
Allen, L.H.3
Infante, P.4
-
8
-
-
0009736597
-
Measurement of thermal diffusivity of small, high conductivity sample using a phase sensitive technique
-
D. DeVecchio, D. Russell, and P. Taborek, “Measurement of thermal diffusivity of small, high conductivity sample using a phase sensitive technique, ” Rev. Sci. Instrum. 66, 3601-3605 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 3601-3605
-
-
Devecchio, D.1
Russell, D.2
Taborek, P.3
-
9
-
-
0033452168
-
A phase-sensitive technique for the thermal characterization of dielectric thin films
-
S. W. Indermuehle and R. B. Peterson, “A phase-sensitive technique for the thermal characterization of dielectric thin films, ” Trans. ASME 121, 528-536 (1999).
-
(1999)
Trans. ASME
, vol.121
, pp. 528-536
-
-
Indermuehle, S.W.1
Peterson, R.B.2
-
10
-
-
0002540840
-
Thermal conductivity determinations by thermal comparator methods
-
R. T. Tye, ed. (Academic, London
-
R. W. Powell, “Thermal conductivity determinations by thermal comparator methods, ” in Thermal Conductivity, R. T. Tye, ed. (Academic, London, 1969), Part 2, pp. 275-338.
-
Thermal Conductivity
, vol.1969
, pp. 275-338
-
-
Powell, R.W.1
-
11
-
-
0002318923
-
Thermal conductivities of thin, sputtered optical films
-
C. H. Henager, Jr., and W. T. Dawlewicz, “Thermal conductivities of thin, sputtered optical films, ” Appl. Opt. 32, 91-101 (1993).
-
(1993)
Appl. Opt
, vol.32
, pp. 91-101
-
-
Henager, C.H.1
Dawlewicz, W.T.2
-
12
-
-
36549101500
-
Measurement of thermal diffusivity for polymer film by flash radiometry
-
N. Tsutsumi and T. Kiyotsukuri, “Measurement of thermal diffusivity for polymer film by flash radiometry, ” Appl. Phys. Lett. 52, 442-444 (1988).
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 442-444
-
-
Tsutsumi, N.1
Kiyotsukuri, T.2
-
13
-
-
84995069522
-
Measurement of thermal diffusivity and specific heat capacity of polymers by laser flash method
-
Y. Agari, A. Veda, and S. Nagai, “Measurement of thermal diffusivity and specific heat capacity of polymers by laser flash method, ” J. Polym. Sci. Part B Polym. Phys. 33, 33-42 (1995).
-
(1995)
J. Polym. Sci. Part B Polym. Phys.
, vol.33
, pp. 33-42
-
-
Agari, Y.1
Veda, A.2
Nagai, S.3
-
14
-
-
0009666836
-
Separation of optical thin film and substrate absorption by means of photothermal surface deformation technique
-
E. Welsch, H. G. Walther, K. Friedrich, and P. Eckhardt, “Separation of optical thin film and substrate absorption by means of photothermal surface deformation technique, ” J. Appl. Phys. 67, 6575-6578 (1990).
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 6575-6578
-
-
Welsch, E.1
Walther, H.G.2
Friedrich, K.3
Eckhardt, P.4
-
15
-
-
57849094077
-
Overview of photothermal characterization of optical thin film coatings
-
H. E. Bennett, A. H. Guenther, M. R. Kozlowski, B. E. New-nam, andM. J. Soileau, eds., Proc. SPIE
-
Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, and M. Kozlowski, “Overview of photothermal characterization of optical thin film coatings, ” in 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, H. E. Bennett, A. H. Guenther, M. R. Kozlowski, B. E. New-nam, andM. J. Soileau, eds., Proc. SPIE 2714, 465-481 (1996).
-
(1996)
27Th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
, vol.2714
, pp. 465-481
-
-
Wu, Z.L.1
Thomsen, M.2
Kuo, P.K.3
Lu, Y.S.4
Stolz, C.5
Kozlowski, M.6
-
16
-
-
0000420373
-
Thermal conductivity and diffusivity measurements in the sub-rm and sub-rs scale on centimeter area samples using a microthermocouple
-
R. Forster and E. Gmelin, “Thermal conductivity and diffusivity measurements in the sub-rm and sub-rs scale on centimeter area samples using a microthermocouple, ” Rev. Sci. Instrum. 67, 4246-4255 (1996).
-
(1996)
Rev. Sci. Instrum.
, vol.67
, pp. 4246-4255
-
-
Forster, R.1
Gmelin, E.2
-
17
-
-
0000693920
-
A new method for measuring thermal conductivity of thin films
-
S. Govorkov and W. Ruderman, “A new method for measuring thermal conductivity of thin films, ” Rev. Sci. Instrum. 68, 3828-3834 (1997).
-
(1997)
Rev. Sci. Instrum.
, vol.68
, pp. 3828-3834
-
-
Govorkov, S.1
Ruderman, W.2
-
18
-
-
0001292732
-
Transient thermoreflectance from thin metal films
-
C. A. Paddock and G. L. Eesley, “Transient thermoreflectance from thin metal films, ” J. Appl. Phys. 60, 285-290 (1986).
-
(1986)
J. Appl. Phys.
, vol.60
, pp. 285-290
-
-
Paddock, C.A.1
Eesley, G.L.2
-
19
-
-
0000881998
-
Thermal-conductivity measurements of GaAs/ AlAs superlattices using a picosecond optical pump-and-probe technique
-
W. S. Capinski, H. J. Maris, T. Ruf, M. Cardona, K. Ploog, and D. S. Katzer, “Thermal-conductivity measurements of GaAs/ AlAs superlattices using a picosecond optical pump-and-probe technique, ” Phys. Rev. B 59, 8105-8113 (1999).
-
(1999)
Phys. Rev. B
, vol.59
, pp. 8105-8113
-
-
Capinski, W.S.1
Maris, H.J.2
Ruf, T.3
Cardona, M.4
Ploog, K.5
Katzer, D.S.6
-
20
-
-
0000963822
-
Thermal cross-track cross talk in phase-change optical disk data storage
-
C. Peng and M. Mansuripur, “Thermal cross-track cross talk in phase-change optical disk data storage, ” J. Appl. Phys. 88, 1214-1220 (2000).
-
(2000)
J. Appl. Phys.
, vol.88
, pp. 1214-1220
-
-
Peng, C.1
Mansuripur, M.2
-
21
-
-
0001661395
-
Versatile polychromatic dynamic testbed for optical disks
-
M. Mansuripur, C. Peng, J. K. Erwin, W. Bletscher, S. G. Kim, S. K. Lee, R. E. Gerber, C. Bartlett, T. D. Goodman, L. Cheng, C. S. Chung, T. Kim, and K. Bates, “Versatile polychromatic dynamic testbed for optical disks, ” Appl. Opt. 36, 9296-9303 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 9296-9303
-
-
Mansuripur, M.1
Peng, C.2
Erwin, J.K.3
Bletscher, W.4
Kim, S.G.5
Lee, S.K.6
Gerber, R.E.7
Bartlett, C.8
Goodman, T.D.9
Cheng, L.10
Chung, C.S.11
Kim, T.12
Bates, K.13
-
22
-
-
0001696051
-
Sources of noise in erasable optical disk data storage
-
C. Peng and M. Mansuripur, “Sources of noise in erasable optical disk data storage, ” Appl. Opt. 37, 921-928 (1998).
-
(1998)
Appl. Opt.
, vol.37
, pp. 921-928
-
-
Peng, C.1
Mansuripur, M.2
-
25
-
-
0031094623
-
Heat transport in thin dielectric films
-
S. M. Lee and D. G. Cahill, “Heat transport in thin dielectric films, ” J. Appl. Phys. 81, 2590-2595 (2000).
-
(2000)
J. Appl. Phys.
, vol.81
, pp. 2590-2595
-
-
Lee, S.M.1
Cahill, D.G.2
|