Heat capacity measurements of Sn nanostructures using a thin-film differential scanning calorimeter with 0.2 nJ sensitivity

Applied Physics Letters

Volumn 70, Issue 1, 1997, Pages 43-45

  Lai, S L ^a   Ramanath, G ^a   Allen, L H ^a   Infante, P ^b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5644255920     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119299     Document Type: Article

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