A new method for measuring thermal conductivity of thin films

Review of Scientific Instruments

Volumn 68, Issue 10, 1997, Pages 3828-3834

  Govorkov, S ^a   Ruderman, W ^a   Horn, M W ^b   Goodman, R B ^b   Rothschild, M ^b  

^a INRAD Inc   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000693920     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148035     Document Type: Article

References (22)

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