Overview of photothermal characterization of optical thin film coatings

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2714, Issue , 1996, Pages 465-481

  Wu, Zhouling ^a   Thomsen, Marshall ^a   Kuo, Pao Kuang ^b   Lu, Y S ^b   Stolz, Christopher J ^c   Kozlowski, Mark R ^c  

^a EASTERN MICHIGAN UNIVERSITY   (United States)

^b WAYNE STATE UNIVERSITY   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Laser damage; Local defects; Nondestructive evaluation; Optical thin films; Overview; Photothermal technique; Thermal conductivity; Weak absorption

Indexed keywords

ABSORPTION; CHARACTERIZATION; DEFECTS; FILMS; FLOW INTERACTIONS; LASER DAMAGE; LASERS; OPTICAL COATINGS; OPTICAL CONDUCTIVITY; OPTICAL MATERIALS; SOLIDS; THERMAL CONDUCTIVITY; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL INSULATING MATERIALS; THERMOANALYSIS; THERMODYNAMIC PROPERTIES; THIN FILM DEVICES; THIN FILMS;

LOCAL DEFECTS; NONDESTRUCTIVE EVALUATION; OPTICAL THIN FILMS; OVERVIEW; PHOTOTHERMAL TECHNIQUE; WEAK ABSORPTION;

OPTICAL FILMS;

EID: 57849094077     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.240409     Document Type: Conference Paper

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